EXAFS spectroscopy : techniques and applications
edited by B.K. Teo and D.C. Joy.
New York : Plenum Press, ©1981.
viii, 275 págs. : ilustraciones ; 26 cm.
ISBN: 0306406543
"Based on proceedings of a symposium held at the meeting of the Materials Research Society, Nov. 26-30, 1979, in Boston".
Incluye referencias bibliográficas e índice.